The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Mar. 28, 2006
Ken Ueno, Kawasaki, JP;
Ryohei Orihara, Tokyo, JP;
Youichi Kitahara, Fuchu, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A time-series data analyzing apparatus which extracts a composite factor time-series pattern from time-series data. The apparatus includes a dividing device which divides the time-series data into pattern generation time-series data and pattern inspection time-series data which do not include pattern generation time-series data. A first generating device generates a transitional pattern including a support time data indicating a transition of support time and having a transition occurrence probability higher than a minimum occurrence probability in the pattern generation time-series data. A second generating device generates frequently appearing integrated transitional patterns. A second computing device computes cause-and-effect strength of each of the frequently appearing integrated transitional patterns using the pattern inspection time-series data. A display device displays the composite factor time-series pattern having the cause-and-effect strength higher than the minimum cause-and-effect strength given preliminarily.