The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2008

Filed:

Apr. 29, 2005
Applicant:

John C. Eidson, Palo Alto, CA (US);

Inventor:

John C. Eidson, Palo Alto, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G04F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for designing a measurement/control system that enables a system designer to explicitly specify the portions of a measurement/control system that are subject to a set of time constraints and the portions of the measurement/control system that are not directly subject to the set of time constraints. A method according to the present teachings includes determining an HRT/SRT boundary between a hard real-time (HRT) portion of a measurement/control system and a soft real-time (SRT) portion of the measurement/control system and determining a buffer for the HTR/SRT boundary in response to a set of time constraints associated with the HRT portion.


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