The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Jun. 26, 2003
Naysen Jesse Robertson, Orangeville, CA (US);
Benjamin Thomas Percer, Roseville, CA (US);
Kirk Yates, Loomis, CA (US);
Naysen Jesse Robertson, Orangeville, CA (US);
Benjamin Thomas Percer, Roseville, CA (US);
Kirk Yates, Loomis, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
The present invention provides systems and methods for performing frequency margin testing of a computer system, such as a server. A system of the invention can include a controller, e.g., a BMC, internal to the computer system and a digital frequency synthesizer that can communicate with the controller and can apply clock frequency to marginable components of the computer system. In response to commands from the controller, the synthesizer generates one or more test frequencies that are applied to one or more of the marginable components. The response of the system to each of the test frequencies is then monitored.