The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Aug. 17, 2004
Kyung-shik Roh, Seongnam-si, KR;
Woo-sup Han, Yongin-si, KR;
Woong Kwon, Seongnam-si, KR;
Young-bo Shim, Seoul, KR;
Yeon-taek OH, Yongin-si, KR;
Ki-cheol Park, Gyeonggi-do, KR;
Kyung-shik Roh, Seongnam-si, KR;
Woo-sup Han, Yongin-si, KR;
Woong Kwon, Seongnam-si, KR;
Young-bo Shim, Seoul, KR;
Yeon-taek Oh, Yongin-si, KR;
Ki-cheol Park, Gyeonggi-do, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method for constructing an artificial mark for autonomous driving of an intelligent system, an apparatus and method for determining the location of an intelligent system using the artificial mark, and an intelligent system employing the same. The apparatus and method for determining the location of an intelligent system includes a projective invariant calculator which calculates a projective invariant of an artificial mark detected from an image taken for a driving place; a search unit which stores a database of indices according to a combination of colors of polygons included in the artificial mark, projective invariants of the artificial marks, and global location information of the artificial marks in the driving place, and searches the database by the calculated projective invariant for obtaining the global location information of the detected artificial mark; and a position information analyzer which analyzes the position of the intelligent system by using the global location information of the detected artificial mark and location information between the intelligent system and the detected artificial mark.