The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Jun. 29, 2004
Ruriko Takano, Tokyo, JP;
Etsu Nishijima, Tokyo, JP;
Hiroshi Tanaka, Tokyo, JP;
Tamae Okano, Tokyo, JP;
Momoe Futagi, Tokyo, JP;
Minako Nakamura, Tokyo, JP;
Ruriko Takano, Tokyo, JP;
Etsu Nishijima, Tokyo, JP;
Hiroshi Tanaka, Tokyo, JP;
Tamae Okano, Tokyo, JP;
Momoe Futagi, Tokyo, JP;
Minako Nakamura, Tokyo, JP;
Shiseido Co., Ltd., Chuo-ku, Tokyo, JP;
Abstract
A classifying method according to an eye form considers the eye form feature as an important factor, to provide an eye cosmetic treatment method for appropriately and quickly making up the eye so that the eye balances and looks large and attractive according to the type categorized by the classifying method. A makeup tool is devised by integrating an eye form feature analyzing method with a form shaping method by markup. An eye form classifying method uses as indexes, three forms, i.e., the eye frame form showing the shape of the eye contour, the eye form showing the three-dimensional shape of the eye, and the angle form of the inner corner and outer edge, the eye forms are classified. The eye forms are classified by comparing the eye form with the eye form of a reference balance eye.