The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2008

Filed:

Sep. 15, 2004
Applicants:

Mikio Aoki, Suwa, JP;

Shinichi Arazaki, Shimosuwa-machi, JP;

Yusuke Takahashi, Suwa, JP;

Inventors:

Mikio Aoki, Suwa, JP;

Shinichi Arazaki, Shimosuwa-machi, JP;

Yusuke Takahashi, Suwa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/405 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing method, apparatus, and program as well as a printer, a print instructing terminal, and an image processing system, capable of reducing or preventing deterioration of the image quality and achieving binarization at high speeds is provided. An image processing method, by which a multi-grayscale image is divided into two regions. These regions are synthesized after error diffusion processing is applied to each region. Before the original image is divided into two regions, errors of respective pixels on a dividing line are diffused to these two regions. It is thus possible to obtain substantially the same processing result as in a case where the error diffusion processing is applied continuously across the entire original image. Hence, it is thus possible to reduce or eliminate stripes or the like in the joined portion that deteriorate the image quality when the divided regions are synthesized after the error diffusion processing, which enables a high-quality image to be obtained.


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