The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Mar. 07, 2007
Motoshi Tanaka, Gamagori, JP;
Yoshinori Matsuyama, Anjo, JP;
Motoshi Tanaka, Gamagori, JP;
Yoshinori Matsuyama, Anjo, JP;
Nidek Co., Ltd., Aichi, JP;
Abstract
An eyeglass frame measurement apparatus includes a holding unit; a rotational base and a tracing stylus arranged on the rotational base. Three-dimensional shape of a frame is measured by detecting the movement of the tracing stylus in a radius direction and a warpage direction. Slit place is integrally arranged with the stylus and a light-projection-and-receiving unit that includes a light-emitting portion and a two-dimensional sensor capable of selecting a received pixel is arranged on the base. The two-dimensional sensor includes first and second light-receiving lines not parallel to each other, and includes a first slit not parallel to the first light-receiving line and a second slit not parallel to the second light-receiving line. The movement of the stylus is detected based on a projection position of the first and second slits detected by the first and second light-receiving lines.