The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
May. 18, 2006
Marcus Steinbichler, Neubeuern, DE;
Armin Maidhof, Rohrdorf, DE;
Matthias Prams, Raubling, DE;
Makus Leitner, Lauterbach, DE;
Marcus Steinbichler, Neubeuern, DE;
Armin Maidhof, Rohrdorf, DE;
Matthias Prams, Raubling, DE;
Makus Leitner, Lauterbach, DE;
Steinbichler Optotechnik GmbH, Neubeuern, DE;
Abstract
A method serves to determine the 3D coordinates of an object. The 3D coordinates of a partial surface () of the object are determined by a 3D measuring device (), which includes one or more detectors () and whose position is determined by a tracking system. The 3D coordinates of an adjacent partial surface () of the object are determined by the 3D measuring device (). The 3D coordinates of an overlap region of he adjacent partial surfaces () are put together by a matching method. In doing so, an error function is determined and minimized iteratively. Furthermore, the error function of a detector () of the 3D measuring device () is determined.