The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Oct. 18, 2006
Eric H. Smith, San Jose, CA (US);
Richard L. Kendrick, Santa Clara, CA (US);
Eric H. Smith, San Jose, CA (US);
Richard L. Kendrick, Santa Clara, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A Fourier Transform Spectrometer ('FTS') system includes a Fizeau FTS having a plurality of sub-collecting elements, adjacent ones of which are separated by a gap distance, and at least one of which has an adjustable optical path. The FTS system further includes a Michelson FTS having an adjustable optical path. The FTS system further includes one or more processors configured to select spectral data collected by the Fizeau FTS corresponding to spatial frequencies for which the Fizeau FTS has a modulation transfer function ('MTF') value above a first threshold level, to select spectral data collected by the Michelson FTS corresponding to spatial frequencies for which the Michelson FTS has a MTF value above a second threshold level, and to combine the selected spectral data from the Fizeau FTS with the selected spectral data from the Michelson FTS.