The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Mar. 30, 2006
Applicant:
Hiroyuki Hiiro, Kanagawa-ken, JP;
Inventor:
Hiroyuki Hiiro, Kanagawa-ken, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
Abstract
Excitation light is inputted to an optical element with uniformly dispersed inorganic fluorescent nanoparticles whose radius is controlled. Fluorescence is emitted from the inorganic fluorescent nanoparticles through photoexcitation and outputted from one end of the optical element. By controlling the radius of the inorganic fluorescent nanoparticles dispersed in the optical element, the wavelength range and spectral width of the light outputted from the optical element are controlled.
Hiiro, Hiroyuki. (2008). Optical measuring apparatus (U.S. Patent No. 7436517). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7436517
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile