The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Apr. 11, 2003
Masamichi Inenaga, Fukuoka, JP;
Shinichi Katsuda, Fukuoka, JP;
Yuji Arinaga, Fukuoka, JP;
Kabushiki Kaisha Yaskawa Denki, Fukuoka, JP;
Abstract
A wafer pre-alignment apparatus according to this invention includes a wafer rotating member, a rotation detecting member, a light emitting member for emitting light toward the periphery of the wafer, a COD linear sensor linearly arranged and signal processing member for detecting the edge position of the wafer to acquire at least one of an orientation flat position, notch position and center position of the wafer on the basis of the edge position detected, and further includes an up-down counter for converting a signal received from the rotation detecting member into rotating position information, a measured angle setting register for storing the rotation position information when the wafer rotating member rotates by an interval angle and a comparator for comparing a set value in the measured angle setting register and a counted value in the up-down counter.