The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2008

Filed:

May. 05, 2006
Applicants:

Jonathan Gorrell, Gainesville, FL (US);

Mark Davidson, Florahome, FL (US);

Jean Tokarz, Hawthorne, FL (US);

Inventors:

Jonathan Gorrell, Gainesville, FL (US);

Mark Davidson, Florahome, FL (US);

Jean Tokarz, Hawthorne, FL (US);

Assignee:

Virgin Islands Microsystems, Inc., Saint Thomas, VI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 25/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Test apparatus for examining the operation and functioning of ultra-small resonant structures, and specifically using an SEM as the testing device and its electron beam as an exciting source of charged particles to cause the ultra-small resonant structures to resonate and produce EMR.


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