The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Nov. 16, 2004
Eugene Tudor Gharis, Sherman, TX (US);
Eugene Tudor Gharis, Sherman, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
According to one embodiment, a method of test error detection for a wafer having a plurality of rows of integrated circuit (IC) chips is provided. The method includes determining that a first number of IC chips that are indicated as failing a test has increased from a first row to a second row immediately following the first row at least by a first threshold. The method also includes determining that a second number of IC chips that are indicated as failing the test has decreased from a previous row to a second row immediately following the previous row at least by a second threshold. The method also includes indicating that a group of one or more rows located between the first row and the second row includes one or more IC chips that have been tested incorrectly.