The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2008

Filed:

Oct. 31, 2003
Applicants:

Hendrik Jalink, Wageningen, NL;

Rob Van Der Schoor, Wageningen, NL;

Adrianus Henricus Cornelis Maria Schapendonk, Wageningen, NL;

Inventors:

Hendrik Jalink, Wageningen, NL;

Rob Van Der Schoor, Wageningen, NL;

Adrianus Henricus Cornelis Maria Schapendonk, Wageningen, NL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01H 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining the quality of plant material by making chlorophyll fluorescence images of the material by scanning the material with a beam of electromagnetic radiation so that the chlorophyll present is excitated, and measuring the chlorophyll fluorescence with an imaging detector. From the fluorescence images obtained with a fast and a slow scan, the image of the quantum efficiency of the photosynthetic system of the plant material is calculated. A device for measuring the chlorophyll fluorescence images and a method and devices for sorting and classifying plant material are also described.


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