The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Jul. 06, 2007
Eric Barbour, Johnston, IA (US);
James Wayne Bing, Ankeny, IA (US);
Guy A. Cardineau, Tempe, AZ (US);
Robert F. Cressman, Jr., Wilmington, DE (US);
Manju Gupta, Carmel, IN (US);
Mary E. Hartnett Locke, Mickleton, NJ (US);
David Hondred, Ankeny, IA (US);
Joseph W. Keaschall, Clive, IA (US);
Michael G. Koziel, Raleigh, NC (US);
Terry Euclaire Meyer, Urbandale, IA (US);
Daniel Moellenbeck, Granger, IA (US);
Kenneth Edwin Narva, Carlsbad, CA (US);
Wilas Nirunsuksiri, Auburn, WA (US);
Steven W. Ritchie, Omaha, NE (US);
Marjorie L. Rudert, Boone, IA (US);
Craig D. Sanders, Bear, DE (US);
Aihua Shao, Johnston, IA (US);
Steven Jeffrey Stelman, San Diego, CA (US);
David S. Stucker, Johnston, IA (US);
Laura Ann Tagliani, Zionsville, IN (US);
William M. Van Zante, Urbandale, IA (US);
Eric Barbour, Johnston, IA (US);
James Wayne Bing, Ankeny, IA (US);
Guy A. Cardineau, Tempe, AZ (US);
Robert F. Cressman, Jr., Wilmington, DE (US);
Manju Gupta, Carmel, IN (US);
Mary E. Hartnett Locke, Mickleton, NJ (US);
David Hondred, Ankeny, IA (US);
Joseph W. Keaschall, Clive, IA (US);
Michael G. Koziel, Raleigh, NC (US);
Terry EuClaire Meyer, Urbandale, IA (US);
Daniel Moellenbeck, Granger, IA (US);
Kenneth Edwin Narva, Carlsbad, CA (US);
Wilas Nirunsuksiri, Auburn, WA (US);
Steven W. Ritchie, Omaha, NE (US);
Marjorie L. Rudert, Boone, IA (US);
Craig D. Sanders, Bear, DE (US);
Aihua Shao, Johnston, IA (US);
Steven Jeffrey Stelman, San Diego, CA (US);
David S. Stucker, Johnston, IA (US);
Laura Ann Tagliani, Zionsville, IN (US);
William M. Van Zante, Urbandale, IA (US);
Pioneer Hi-Bred International, Inc., Johnston, IA (US);
E.I. du Pont de Nemours and Company, Wilmington, DE (US);
Dow Agrosciences, LLC, Indianapolis, IN (US);
Abstract
The invention provides DNA compositions that relate to transgenic insect resistant maize plants. Also provided are assays for detecting the presence of the maize TC1507 event based on the DNA sequence of the recombinant construct inserted into the maize genome and the DNA sequences flanking the insertion site. Kits and conditions useful in conducting the assays are provided.