The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Mar. 28, 2006
Daniel J. Baker, Austin, TX (US);
J. Christopher White, Austin, TX (US);
Ciro T. Nishiguchi, Austin, TX (US);
Daniel J. Baker, Austin, TX (US);
J. Christopher White, Austin, TX (US);
Ciro T. Nishiguchi, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A test system and method of configuring therefor. A test system includes a plurality of interface circuits for communicating with a device under test (DUT). The test system further includes a first memory for storing test vectors, a second memory for storing selection codes, and a third memory for storing configuration sets. Each selection code indicates an association between a test vector and a configuration set. Each configuration set may be associated with one or more of the test vectors. The configuration sets include information for configuring the interface circuits during communications between the test system and the DUT for each test vector. Each configuration set in the third memory is unique with respect to the other configuration sets, and the number of configuration sets may be less than the number of test vectors.