The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Mar. 31, 2005
Ronald Leaton Skeoch, Lake Forest, CA (US);
Sherrie Le Houang, El Monte, CA (US);
Matthew KY Phuong, Rosemead, CA (US);
Jay Hyon Kang, Chino, CA (US);
Ronald Leaton Skeoch, Lake Forest, CA (US);
Sherrie Le Houang, El Monte, CA (US);
Matthew Ky Phuong, Rosemead, CA (US);
Jay Hyon Kang, Chino, CA (US);
Unisys Corporation, Blue Bell, PA (US);
Abstract
An embodiment of the present invention is a technique for testing core functionality of a clustered system having a plurality of nodes. A cluster population test that includes populating the clustered system with cluster-aware applications is performed. A crash reboot test is performed to stress core operations running within the clustered system; the crash reboot test includes executing a series of crashes or reboots on a subset of the nodes. A move test that includes moving resources to a selected node of the clustered system and verifying that the resources remain on-line at the selected node is performed. A stop test that includes stopping cluster service on a selected subset of nodes of the clustered system and restarting the cluster service on the selected subset of nodes is performed. A Blue Screen Of Death (BSOD) test that includes crashing in BSOD mode one of the nodes of the clustered system and testing reservation release on the crashed node is performed.