The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Apr. 20, 2001
Alexander Berk, Sharon, MA (US);
Prabhat K. Acharya, Burlington, MA (US);
Lawrence S. Bernstein, Lexington, MA (US);
Gail P. Anderson, Boulder, CO (US);
Paul Lewis, Falls Church, VA (US);
James H. Chetwynd, Stoneham, MA (US);
Michael L. Hoke, Leominster, MA (US);
Alexander Berk, Sharon, MA (US);
Prabhat K. Acharya, Burlington, MA (US);
Lawrence S. Bernstein, Lexington, MA (US);
Gail P. Anderson, Boulder, CO (US);
Paul Lewis, Falls Church, VA (US);
James H. Chetwynd, Stoneham, MA (US);
Michael L. Hoke, Leominster, MA (US);
Spectral Sciences, Inc., Burlington, MA (US);
Abstract
A radiative transport band model algorithm has been developed for prediction and analysis of high spectral resolution radiometric measurements. Atomic and molecular line center absorption is determined from finite spectral bin equivalent widths. A new mathematically exact expansion for finite bin equivalent widths provides high accuracy at any desired spectral resolution. The temperature and pressure dependent Voigt line tail spectral absorption contributing to each spectral bin is pre-computed and fit to Padé approximants for rapid and accurate accounting of neighboring-to-distant lines.