The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7433445 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 07, 2008

Filed:

Mar. 06, 2007
Applicants:

Naoyuki Okada, Minami-ashigara, JP;

Tomonari Sendai, Minami-ashigara, JP;

Inventors:

Naoyuki Okada, Minami-ashigara, JP;

Tomonari Sendai, Minami-ashigara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A radiation application time upper limit calculator calculates a radiation application time upper limit based on a subject thickness, as measured by a subject thickness measuring unit. While an X-ray tube is controlled according to exposure conditions that have been set in order to apply a radiation X to a breast to capture a radiation image thereof, an X-ray tube controller compares the applied radiation time with the radiation application time upper limit. If the applied radiation time exceeds the radiation application time upper limit, then application of radiation to the subject is interrupted, so as to prevent an inappropriate radiation dosage from being applied to an X-ray detector.


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Okada, Naoyuki. (2008). Apparatus for and method of capturing radiation image (U.S. Patent No. 7433445). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7433445

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