The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Jan. 31, 2007
Joachim Baumann, München, DE;
Christian David, Lauchringen, DE;
Martin Engelhardt, München, DE;
Jörg Freudenberger, Eckental, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Thomas Mertelmeier, Erlangen, DE;
Franz Pfeiffer, Brugg, CH;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, München, DE;
Joachim Baumann, München, DE;
Christian David, Lauchringen, DE;
Martin Engelhardt, München, DE;
Jörg Freudenberger, Eckental, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Thomas Mertelmeier, Erlangen, DE;
Franz Pfeiffer, Brugg, CH;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, München, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A focus-detector arrangement of an X-ray apparatus is disclosed for generating projective or tomographic phase contrast recordings of an observed region of a subject. In at least one embodiment, the arrangement includes a radiation source which emits a coherent or quasi-coherent X-radiation and irradiates the subject, a phase grating which is arranged behind the subject in the beam path of the radiation source and generates an interference pattern of the X-radiation in a predetermined energy range, and an analysis-detector system which detects at least the interference pattern generated by the phase grating in respect of its phase shift with position resolution. Further, the beam path of the X-radiation used diverges in at least one plane between the focus and the detector.