The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Nov. 29, 2005
Applicant:
Juergen Riedmann, Harthausen, DE;
Inventor:
Juergen Riedmann, Harthausen, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/14 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
An optical arrangement for a microscope, in particular for a scanning microscope, with a beam splitterarranged in a divergent and/or convergent beam path for separating an illumination lightthat is produced by an illumination source from a detection lightthat is emitted by a sample being tested, which with regard to reliable correction of imaging errors can be implemented and developed even when using thick beam splitterssuch that the beam splitteris wedge-shaped and implemented as a beam splitter plate for reflection primarily at a glass-air interface. Furthermore, a microscope with such an optical arrangement is disclosed.