The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Apr. 30, 2004
Robert D. Klein, Farmington Hills, MI (US);
Craig F. Lapan, Brighton, MI (US);
George E. Reasoner, Jr., Tecumseh, MI (US);
Robert D. Klein, Farmington Hills, MI (US);
Craig F. Lapan, Brighton, MI (US);
George E. Reasoner, Jr., Tecumseh, MI (US);
Unisys Corporation, Blue Bell, PA (US);
Abstract
A document processing system comprising an image capture subsystem for capturing selected image metrics and at least one image rendition from a plurality of documents and for determining if at least one of the selected image metrics for any of the at least one image rendition does not successfully compare against preselected image quality metric threshold values. An image quality flag is generated for any of the at least one image rendition if it does not successfully compare, and a record entry for each imaged document having at least one flagged image rendition is created in an image quality flag file. An image index file for individually accessing the image renditions is modified to include a reference to the corresponding image quality flag file record entry The document processing system may optionally compare selected document metrics against preselected document metrics in a similar manner. Image defects in the plurality of documents can be identified by examining the record entries in the image quality flag file.