The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Jun. 03, 2005
Eric Szarmes, Honolulu, HI (US);
Huan MA, Honolulu, HI (US);
Eric Szarmes, Honolulu, HI (US);
Huan Ma, Honolulu, HI (US);
University of Hawaii, Honolulu, HI (US);
Abstract
A Fourier transform spectrometer based on a modified Sagnac interferometer is described. The instrument uses one or more gratings as dispersive elements to greatly improve the spectral resolution, and in-line optics to match the beam size in the interferometer to optimize the efficiency. The resolution can approach about 0.6 GHz at about 632.8 nm (λ/Δλ=8.4×105). A CCD or photodiode array is used as the detector and the fast Fourier transform of the fringe pattern is performed by a computer. Some embodiments employ no mechanically moving parts; therefore, they are compact and easy to align. Practical applications include remote sensing, process monitoring, and basic research. The fast response time of the detector also allows real time spectral analysis.