The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Sep. 20, 2006
Stephen C. Hsu, Sunnyvale, CA (US);
Stephen C. Hsu, Sunnyvale, CA (US);
Canesta, Inc., Sunnyvale, CA (US);
Abstract
A preferably parametrically defined calibration target pattern definable in real-world coordinates (X,Y) is used to spatially calibrate a camera system acquiring images in pixel coordinates (x,y). The calibration target pattern is used to produce a unique 1:1 mapping enabling the camera system to accurately identify each point in the calibration target pattern point mapped to each pixel in the acquired image. Preferably the calibration target pattern is pre-distorted and includes at least two sinusoids that create a pattern of distorted wavefronts that when imaged by the camera system will appear substantially linearized. Since wavefront locations on the calibration target pattern were known, a mapping between those wavefronts and the substantially linearized wavefront pattern on the camera system captured image can be carried out. Demodulation of the captured image enables recovery of the continuous wave functions therein, using spectral analysis and iteration.