The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Mar. 31, 2004
Ruvin Deych, Brookline, MA (US);
Bernard M. Gordon, Manchester-by-the-Sea, MA (US);
Oscar Khutoryansky, Newton, MA (US);
Ruvin Deych, Brookline, MA (US);
Bernard M. Gordon, Manchester-by-the-Sea, MA (US);
Oscar Khutoryansky, Newton, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
A method and system is presented in radiography for optimizing image quality of an object (e.g. an anatomical region of a patient), while minimizing the radiation dose to the patient. X-ray exposure parameters, such as operating voltage (kVp), operating current (mA), focal spot size, and soft x-ray filter combination, are dynamically controlled during the x-ray exposure. During at least two different sampling intervals and at two different kVp levels, x-rays are passed through the object, and detected by sensors located between the object and the image plane. After the last sampling interval, the sensor output signals and the measured thickness of the object are used to evaluate the optimal settings for the x-ray exposure parameters. The x-ray exposure parameters are set to these optimal settings for the remainder of the exposure period.