The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Jan. 07, 2004
Isao Iwaguchi, Tokyo, JP;
Hideo Miyazawa, Tokyo, JP;
Mitsuo Watanabe, Tokyo, JP;
Kozo Yamazaki, Tokyo, JP;
Masanori Ohkawa, Tokyo, JP;
Isao Iwaguchi, Tokyo, JP;
Hideo Miyazawa, Tokyo, JP;
Mitsuo Watanabe, Tokyo, JP;
Kozo Yamazaki, Tokyo, JP;
Masanori Ohkawa, Tokyo, JP;
Fujitsu Limited, Kawasaki, JP;
Fujitsu Frontech Limited, Tokyo, JP;
Abstract
A plurality of bar-code candidate areas are calculated from scan data that is acquired by scanning a bar code. Feature data, which represents a specific feature, is calculated for each of the bar-code candidate areas. The bar-code candidate areas are evaluated based on their feature data to thereby determine a bar-code candidate area that has the highest probability of being a bar code. The specific feature includes any one or more of length of a differential waveform, average energy, and number of peaks in the differential waveform.