The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2008

Filed:

Aug. 26, 2005
Applicant:

Dennis P. Sarr, Kent, WA (US);

Inventor:

Dennis P. Sarr, Kent, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus, systems, and methods for inspecting a structure are provided which use a sensor holder constructed from rapid prototyping, such as stereolithography, and which is configured to support a plurality of inspection sensors typically arranged in an ordered matrix array and possibly with one or more additional inspection sensors aligned for inspection of difficult to inspect features of a structure such as radius corner or edge features. Rapid prototype integrated matrix array inspection apparatus, systems, and methods provide fast and efficient methods of constructing custom inspection devices.


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Sarr, Dennis. (2008). Rapid prototype integrated matrix ultrasonic transducer array inspection apparatus, systems, and methods (U.S. Patent No. 7430913). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7430913

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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