The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2008
Filed:
Aug. 26, 2004
Applicants:
Xinlin Qing, Cupertino, CA (US);
Chang Zhang, Santa Clara, CA (US);
Irene LI, Stanford, CA (US);
Inventors:
Assignee:
Acellent Technologies, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for both detecting and analyzing a change in the loading condition of a structure. A flexible substrate is employed, in which a distributed network of sensors is built. This substrate is either affixed to the surface of the structure, or built within it, so as to be able to detect propagating stress waves. After load change is detected, the resulting sensor signals are analyzed to determine the location, severity, and/or any characteristic frequencies of the load change. This information is then used to determine an appropriate response.