The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2008
Filed:
Jun. 27, 2005
Mats I. Larsson, Sunnyvale, CA (US);
Cetin Kilic, Mountain View, CA (US);
Ariana Zimbouski, Berkeley, CA (US);
Juan Cai, Fremont, CA (US);
Mats I. Larsson, Sunnyvale, CA (US);
Cetin Kilic, Mountain View, CA (US);
Ariana Zimbouski, Berkeley, CA (US);
Juan Cai, Fremont, CA (US);
Nanostellar, Inc., Redwood City, CA (US);
Abstract
The size distributions corresponding to the three-dimensional (3D) shapes of particles are estimated from a 3D-to-2D projection matrix and a two-dimensional (2D) image of the particles that is obtained using TEM. Two different methods to generate a 3D-to-2D projection matrix are described. The first method determines the matrix coefficients assuming equal probability for all high-symmetry projections. The second method employs a large set of 3D-to-2D projection matrices with randomly generated coefficients satisfying the high-symmetry projection constraint. The second method is a general method to determine 3D-to-2D projection matrices based on the assumption that certain high-symmetry projections are present for the system under investigation.