The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2008
Filed:
Aug. 14, 2006
Idreas A. Mir, San Diego, CA (US);
R. Nicholson Gibson, Boulder, CO (US);
Idreas A. Mir, San Diego, CA (US);
R. Nicholson Gibson, Boulder, CO (US);
QUALCOMM, Incorporated, San Diego, CA (US);
Abstract
Techniques to test a wireless communication link using configurable channels and rates. A W-Markov test service may be invoked to test and/or verify the performance of the downlink and/or uplink using at least one transport channel for each link. Each transport channel may be individually configured. The W-Markov test service supports generation of test data based on a defined data sequence or a pseudo-random number generator. The testing may be performed based on a particular deterministic or pseudo-random activity model. For voice call testing, a first-order Markov model may be used to model voice activity and to select the rate to use for each transmission time interval (TTI). For Adaptive Multi-Rate (AMR), testing may be performed based on configurable AMR rates and silence descriptor (SID) types. The test data generation processes are synchronized between the transmitter and receiver. Bit, frame, and/or block error rates and other statistics may be collected.