The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2008

Filed:

Sep. 23, 2005
Applicants:

Ritesh Mastipuram, Santa Clara, CA (US);

Rajesh Manapat, San Jose, CA (US);

Chor Fung Chia, Fremont, CA (US);

Inventors:

Ritesh Mastipuram, Santa Clara, CA (US);

Rajesh Manapat, San Jose, CA (US);

Chor Fung Chia, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory architecture and a method of operating the same can provide a substantially constant data valid window (DVW) irrespective of a temperature for the memory device. Generally, a memory device can receive an access request, determine a temperature of the memory device, and switch a number of delay elements in an output buffer in response to the temperature of the memory device. In one embodiment, a memory device can have a multi-stage input-output (I/O) buffer and an automatic temperature compensated circuit that samples a temperature of the memory and then switches a number of delay elements in the I/O buffer into a data path between the memory and the output to provide a substantially constant DVW over changes in temperature.


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Mastipuram, Ritesh. (2008). Method and device for improved data valid window in response to temperature variation (U.S. Patent No. 7430140). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7430140

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