The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2008

Filed:

Nov. 21, 2001
Applicants:

Thomas Bertin-mourot, Paris, FR;

Jean-pierre Douche, Le Plessis Brion, FR;

Daniel Germond, Combs la Ville, FR;

Paul-henri Guering, Paris, FR;

Yves Surrel, St. Etienne, FR;

Inventors:

Thomas Bertin-Mourot, Paris, FR;

Jean-Pierre Douche, Le Plessis Brion, FR;

Daniel Germond, Combs la Ville, FR;

Paul-Henri Guering, Paris, FR;

Yves Surrel, St. Etienne, FR;

Assignee:

Saint-Gobain Glass France, Courbevoie, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A process for scanning a surface of a substrate, which process takes at least one reflected image of at least one test pattern on the surface and extracts by digital processing local phases in two directions. Variations in local slopes are calculated by digital processing from the local phases to deduce therefrom variations in curvature or variations in altitude of the surface.


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