The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2008
Filed:
Nov. 03, 2006
Yuanjing LI, Beijing, CN;
Qingjun Zhang, Beijing, CN;
Shuqing Zhao, Beijing, CN;
Zhude Dai, Beijing, CN;
Nianming Jiang, Beijing, CN;
Qitian Miao, Beijing, CN;
Zhijun LI, Beijing, CN;
Yuanjing Li, Beijing, CN;
Qingjun Zhang, Beijing, CN;
Shuqing Zhao, Beijing, CN;
Zhude Dai, Beijing, CN;
Nianming Jiang, Beijing, CN;
Qitian Miao, Beijing, CN;
Zhijun Li, Beijing, CN;
Tsinghua University, Beijing, CN;
Nuetech Company Limited, Beijing, CN;
Abstract
The present invention discloses a solid state detector module structure, comprising: an upper support plate and a lower support plate provided opposing to each other, a collimator provided between the upper support plate and the lower support plate for collimating the incident rays; and solid state detector arrays provided between the upper support plate and the lower support plate at the rear side of the collimator in the transmitting direction of the rays, wherein the solid state detector arrays comprises an upper and lower rows, with the upper row of the solid state detector array fixed under the upper support plate, and the lower row thereof fixed on the lower support plate. The present invention further discloses a radiation imaging system having the same. The solid state detector module structure of present invention decreases the scattering of ray beams, increases the capabilities of scattering resistance and the definition of image and enhances inspection speed compared with prior art.