The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2008
Filed:
Mar. 15, 2006
Dietrich Lueerssen, Kidlington, GB;
Rajeev J. Ram, Arlington, MA (US);
Janice A. Hudgings, South Hadley, MA (US);
Peter M. Mayer, Cambridge, MA (US);
Dietrich Lueerssen, Kidlington, GB;
Rajeev J. Ram, Arlington, MA (US);
Janice A. Hudgings, South Hadley, MA (US);
Peter M. Mayer, Cambridge, MA (US);
Mass Institute of Technology (MIT), Cambridge, MA (US);
Mount Holyoke College, South Hadley, MA (US);
Abstract
The invention is directed to systems and methods of digital signal processing and in particular to systems and methods for measurements of thermoreflectance signals, even when they are smaller than the code width of a digital detector used for detection. For example, in some embodiments, the number of measurements done is selected to be sufficiently large so as to obtain an uncertainty less than the code width of the detector. This allows for obtaining images having an enhanced temperature resolution. The invention is also directed to methods for predicting the uncertainty in measurement of the signal based on one or more noise variables associated with the detection process and the number of measurement iterations.