The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2008
Filed:
Oct. 27, 2005
Laurent Fournier, Givat Ella, IL;
Avi Ziv, Haifa, IL;
Laurent Fournier, Givat Ella, IL;
Avi Ziv, Haifa, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Functional coverage techniques during design verification using cross-product coverage models and hole analysis are enhanced by the use of coverage queries. After running a test suite, a core set of non-covered events is specified. A coverage query is then automatically constructed and executed on the test results to identify a hole in the functional coverage that satisfies conditions of the coverage query and includes the core set. The results of the query are presented as a simplified view of the coverage of the events in the cross-product space. Use of coverage queries allows a verification team to focus on specific areas of interest in the coverage space and to deal practically with highly complex coverage models. It also avoids the burden of producing and evaluating complete hole analysis reports.