The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2008
Filed:
Jan. 20, 2006
Yoichiro Aihara, Ome, JP;
Masahiko Nishiyama, Ome, JP;
Daisuke Sasaki, Ome, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In relation to the built-in self-test circuit (BIST circuit) for testing CAM macros, the present invention is intended to provide a means to enable reduction in amount of materials as required for wiring channel region for signal distribution, buffer, FF, etc., and in number of LSI pins, and further, to facilitate mounting on chips. The data generators for CAM testing, inserted between the APG for RAMs and CAM macros, create data to write to the CAM macros by obtaining the address signals directly or by decoding the same signals. The APG is common to all the memory macros, and testing proper to each CAM can be carried out by changing over the operation of the inserted data generators by means of the control signal. The data generators are arranged in the proximity of the CAM macros, the circuits to be tested.