The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2008
Filed:
May. 15, 2002
Alexander Benedix, München, DE;
Reinhard Düregger, Poing, DE;
Robert Hermann, Pipinsried, DE;
Wolfgang Ruf, Friedberg, DE;
Alexander Benedix, München, DE;
Reinhard Düregger, Poing, DE;
Robert Hermann, Pipinsried, DE;
Wolfgang Ruf, Friedberg, DE;
Infineon Technologies AG, Neubiberg, DE;
Abstract
Disclosed is a test method for testing a data store having an integrated test data compression circuit where the data store has a memory cell array with a multiplicity of addressable memory cells, read/write amplifiers for reading and writing data to the memory cell via an internal data bus in the data store and a test data compression circuit which compresses test data sequences, which are each read serially from the memory cell array, with stored reference test data sequences in order to produce a respective indicator data item which indicates whether at least one data error has occurred in the test data sequence which has been read.