The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2008
Filed:
Sep. 21, 2006
Akihiko Nishide, Tokyo, JP;
Akira Hagiwara, Tokyo, JP;
Yasuhiro Imai, Tokyo, JP;
Makoto Gohno, Tokyo, JP;
Akihiko Nishide, Tokyo, JP;
Akira Hagiwara, Tokyo, JP;
Yasuhiro Imai, Tokyo, JP;
Makoto Gohno, Tokyo, JP;
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
The present invention is intended to improve image quality ensured by a conventional (axial) scan, a cine scan, or a helical scan performed by an X-ray CT apparatus including a two-dimensional area X-ray detector that has a matrix structure. In helical scan image reconstruction based in three-dimensional image reconstruction performed in an X-ray CT apparatus including a two-dimensional area X-ray detector that is represented by a multi-array X-ray detector or a flat-panel X-ray detector and that has a matrix structure, an image expressing a slice thickness larger than the width of one detector array included in a multi-array X-ray detector is reconstructed according to either of a method of convoluting a z-direction filter to projection data items in the direction of detector arrays (z direction) and a method of convoluting a filer to a tomographic image space in the z direction. The two methods are optimized in terms of a calculation time and tomographic image quality. Consequently, a tomographic image can be quickly reconstructed with high quality.