The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2008

Filed:

Jul. 24, 2006
Applicants:

Clarence T. Tegreene, Redmond, WA (US);

David L. Dickensheets, Bozeman, MT (US);

Inventors:

Clarence T. Tegreene, Redmond, WA (US);

David L. Dickensheets, Bozeman, MT (US);

Assignees:

Microvision, Inc., Redmond, WA (US);

Montana State University, Bozeman, MT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning system device has a predetermined aberration as it scans or switches light along selected optical paths. A deformable membrane receives the light and introduces an inverse 'aberration' that offsets that of the scanning system. In one embodiment the scanning system includes a torsion arm that supports an oscillatory body. The torsion arm and/or body can be machined from metal, micromachined in silicon or formed in a variety of other ways. Alternatively, the scanning system may include a rotating polygonal scanner or other type of optical scanner. In another approach, an optical switch replaces the scanner.


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