The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2008

Filed:

Oct. 11, 2005
Applicant:

Yoshihiro Ishibe, Utsunomiya, JP;

Inventor:

Yoshihiro Ishibe, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanning apparatus which is free from any deterioration of drawing performance and which can be miniaturized and simplified in overall configuration, and an image forming apparatus using the optical scanning apparatus are provided. The optical scanning apparatus includes: a light source unit; an incident optical system for guiding a light beam emitted from the light source unit to a deflecting unit; and an imaging optical system for guiding the light beam deflected by the deflecting unit onto a surface to be scanned. The incident optical system includes an anamorphic condenser lens having a refractive power in a main scanning cross section and a refractive power in a sub-scanning cross section which are different from each other, and the imaging optical system has a refractive power with which a deflective surface of the deflecting unit or a vicinity of the deflective surface and the surface to be scanned are made in conjugate relation with each other, and also satisfies a conditional expression.


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