The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2008
Filed:
Aug. 04, 2006
Marc L. Dufour, Montreal, CA;
Guy Lamouche, Montreal, CA;
Bruno Gauthier, St. Sulpice, CA;
National Research Council of Canada, Ottawa, Ontario, CA;
Abstract
A scanning optical delay line includes an optical path element that rotates about its central axis, such that a face is intermittently incident a beam of light to be optically delayed. When the beam is not incident the face, it is reflected onto a reinsertion line which provides a second opportunity for the beam to intersect the optical path element. The optical path element may include one or more parallelogram prisms, or parallel reflective surfaces to provide a substantially linear optical path length variation during the scan, which is produced by the rotation of the optical path element. A highly linear part of the rotation can be maximally used providing a high duty cycle, high linearity scanning optical delay line that permits high quality, high data rate applications.