The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2008

Filed:

May. 17, 2007
Applicants:

Leonard S. Haynes, Rockville, MD (US);

Eric Van Doom, Frederick, MD (US);

Inventors:

Leonard S. Haynes, Rockville, MD (US);

Eric van Doom, Frederick, MD (US);

Assignee:

Intelligent Automation, Inc., Rockville, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/02 (2006.01); G01R 31/02 (2006.01); G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and system for non-destructive evaluation for a conducting structure by measuring the electrical impulse response thereof including applying a PRBS test input signal to the conducting structure, detecting an output signal from the conducting structure and processing the data to assess the condition of the conducting structure via changes in the electrical impulse response and to locate any defects along the conducting structure.


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