The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2008

Filed:

Oct. 28, 2003
Applicants:

Gareth Rhys Jones, Cheshire, GB;

Robert Harold Bateman, Cheshire, GB;

Inventors:

Gareth Rhys Jones, Cheshire, GB;

Robert Harold Bateman, Cheshire, GB;

Assignee:

Micromass UK Limited, Manchester, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/30 (2006.01); H01J 49/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A magnetic sector mass spectrometer is disclosed comprising an ion detector () wherein a reflecting electrode () is used to divide an ion beam in the direction of mass dispersion into two separate ion beams. The two ion beams are directed onto two detectors which preferably comprise two or more conversion dynodes () and two or more corresponding microchannel plate detectors () to detect electrons produced by the conversion dynodes (). If the signal from the two detectors differs substantially then the ion beam can be determined to include interference ions. Conversely, if the signal from the two detectors is substantially the same then the ion beam can be determined to be substantially free from interference ions.


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