The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2008

Filed:

Aug. 13, 2004
Applicants:

Kotaro Akashi, Kyoto, JP;

Hitoshi Hirai, Kyoto, JP;

Inventors:

Kotaro Akashi, Kyoto, JP;

Hitoshi Hirai, Kyoto, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/76 (2006.01); G01N 21/00 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analysis method and analysis apparatus involve analysis for a sulfur component using ultraviolet fluorescence capable of removing the interferential influence of NO with good efficiency and certainty to thereby measure a concentration of only sulfur components such as SOand others even in continuous measurement over a long term with a high precision. An analysis method involves analysis for a sulfur component using ultraviolet fluorescence. A sample gas is illuminated with ultraviolet and fluorescence is emitted by the ultraviolet illumination and detected to measure concentrations of sulfur components including at least SOin the sample gas. NO, which is an interferential component in the sample gas, is oxidized to nitrogen dioxide, followed by the illuminating of the sample gas with ultraviolet.


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