The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2008

Filed:

May. 23, 2005
Applicants:

Yoshiro Kawahara, Okayama, JP;

Hiroaki Shibata, Saitama, JP;

Inventors:

Yoshiro Kawahara, Okayama, JP;

Hiroaki Shibata, Saitama, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 18/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A high-frequency cutting instrument for an endoscope is provided. The instrument is provided with a flexible sheath formed of insulating material, a high-frequency electrode placed to be exposed on a lateral part of the flexible sheath in the vicinity of a tip of the flexible sheath, and a conductive wire inserted into the flexible sheath and electrically connected to the high-frequency electrode. In this structure, the flexible sheath is separated into a distal sheath and a proximal sheath at a separating position along the flexible sheath. The distal sheath and the proximal sheath are connected together at the separating position to be rotatable relative to each other around an axis line of the flexible sheath. Further, the distal sheath is rotated relative to the proximal sheath around the axis line by rotating the conductive wire around the axis line at a proximal end of the proximal sheath.


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