The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2008
Filed:
Jan. 31, 2005
James T. Koo, Kowloon, HK;
James T. Koo, Kowloon, HK;
Nanotech Corporation, Hong Kong, CN;
Abstract
A relatively small amount of programmable or reprogrammable logic (pro-Logic) is included in a mostly-ASIC device so that such re/programmable logic can be used as a substitute for, or for bypassing a fault-infected ASIC block (if any) either permanently or at times when the fault-infected ASIC block is about to perform a fault-infected operation (bug-infected operation). The substitution or bypass does not have to be a permanent one that is in effect at all times for the entirety of the fault-infected ASIC block. Instead affected outputs of the faulty ASIC block can be disabled from working just at the time they would otherwise initiate or propagate an error. Such fault-infected operations of the temporarily deactivated ASIC block(s) may be substituted for by appropriately programmed pro-Logic at the appropriate times. Thus, a fault-infected ASIC block that is 99% good (for example) and operates improperly just 1% of the time can continue to be gainfully used for that 99% of the time when its operations are fault free and can be blocked from having its erroneous output(s) used only in the 1% time periods (example) when its behavior is faulty. During those faulty times, a relatively small amount of the pro-Logic can be used as a fault-correcting or fault-bypassing substitute for the fault-infected ASIC block. This substitution or bypassing can be activated after initial design of the mostly-ASIC circuitry and/or after pilot production and/or mass production thereby providing for cost saving and faster time to market and/or for repair or maintenance even years after installation and use of the mostly-ASIC device.