The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2008
Filed:
Oct. 14, 2004
Björn Flach, Vila do Condo, PT;
Andreas Logisch, München, DE;
Wolfgang Ruf, Friedberg, DE;
Michael Schittenhelm, Poing, DE;
Martin Schnell, München, DE;
Björn Flach, Vila do Condo, PT;
Andreas Logisch, München, DE;
Wolfgang Ruf, Friedberg, DE;
Michael Schittenhelm, Poing, DE;
Martin Schnell, München, DE;
Infineon Technologies AG, Munich, DE;
Abstract
The invention provides a method for testing circuit units to be tested in a test apparatus, different identification units being assigned to the circuit units to be tested, the circuit units to be tested being connected to the test apparatus, a tester data stream including command blocks being output from the test apparatus, the tester data stream being compared with the identification units, the circuit unit to be tested, the identification unit of which matches the tester data stream output by the test apparatus, being activated and at least one command block for this circuit unit to be tested being processed in the circuit unit to be tested, whereupon the circuit unit to be tested is deactivated.