The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2008
Filed:
Mar. 01, 2002
Thomas Maucksch, Tuntenhausen, DE;
Uwe Bäder, Kreuznach, DE;
Thomas Maucksch, Tuntenhausen, DE;
Uwe Bäder, Kreuznach, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method for testing the (Bit) Error Ratio BER of a device against a maximal allowable (Bit) Error Ratio BERwith a early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns bits of the output of the device are measured, thereby ne erroneous bits of the ns bits are detected. PDand/or PDare obtained, whereby PDis the worst possible likelihood distribution and PDis the best possible likelihood distribution containing the measured ne erroneous bits with the probablility D. The average numbers of erroneous bits NEand NEfor PDand PDare obtained. NEand NEare compared with NE=BER×ns. If NEis higher than NEor NEis lower than NEthe test is stopped.