The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2008
Filed:
Feb. 03, 2004
Peilin Song, Lagrangeville, NY (US);
Tian Xia, Burlington, VT (US);
Alan J. Weger, Mohegan Lake, NY (US);
Franco Stellari, Ho-Ho-Kus, NJ (US);
Stanislav V. Polonsky, Putnam Valley, NY (US);
Peilin Song, Lagrangeville, NY (US);
Tian Xia, Burlington, VT (US);
Alan J. Weger, Mohegan Lake, NY (US);
Franco Stellari, Ho-Ho-Kus, NJ (US);
Stanislav V. Polonsky, Putnam Valley, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.