The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2008

Filed:

Apr. 19, 2006
Applicants:

Raymond G. Beausoleil, Redmond, WA (US);

William J. Munro, Bristol, GB;

Timothy P. Spiller, Bristol, GB;

Pieter Kok, Oxford, GB;

Sean D. Barrett, Bristol, GB;

Kae Nemoto, Tokyo, JP;

Inventors:

Raymond G. Beausoleil, Redmond, WA (US);

William J. Munro, Bristol, GB;

Timothy P. Spiller, Bristol, GB;

Pieter Kok, Oxford, GB;

Sean D. Barrett, Bristol, GB;

Kae Nemoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various embodiments of the present invention are directed to methods for determining a phase shift acquired by an entangled N-qubit system represented by a NOON state. In one embodiment, a probe electromagnetic field is coupled with each qubit system. The phase shift acquired by the qubit systems is transferred to the probe electromagnetic field by transforming each qubit-system state into a linear superposition of qubit basis states. An intensity measurement is performed on the probe electromagnetic field in order to obtain a corresponding measurement result. A counter associated with a measurement-result interval is incremented, based on the measurement result falling within the measurement-result interval. A frequency distribution is produced by normalizing the counter associated with each measurement-result interval for a number of trials. The phase shift is determined by fitting a probability distribution associated with the probe electromagnetic field to the frequency distribution as a function of the phase shift.


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